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Niranjan Khasgiwale is a vice president in the Imaging and Process Control group at Applied Materials, responsible for real-time measurement and control solutions. He has more than 20 years of marketing experience in the semiconductor equipment industry. Niranjan holds a master’s degree and Ph.D. in materials science from Dartmouth College and Lehigh University respectively, and a B.Tech in metallurgy from the Indian Institute of Technology.
Metrology allows process engineers to see the results of process steps. Today, driving improvements in chip performance, power and area/cost (PPAC) requires novel architectures and exotic material stacks. This is introducing new sources of atomic-scale variation that can negatively impact chip performance and yield. It is becoming imperative to “watch” the deposition process as it occurs to control variability and deliver repeatable performance.