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Shimon Levi
Shimon Levi is part of the marketing and technology group for Applied Materials’ SEM product line. He focuses on research for next-generation SEM metrology applications. He has authored more than 30 publications and holds four U.S patents. He received a B.Sc. and M.Sc in chemistry from the Technion, Israel Institute of Technology.
Patterning challenges for the semiconductor industry are growing as the number of multi-patterned layers being used in the 10nm and beyond nodes increase.
