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Ortal Yesodi is a product marketing manager in the Process Diagnostics and Control group at Applied Materials. She joined Applied in 2013 and holds a bachelor’s degree in electrical and computer engineering from Ben Gurion University of the Negev.
This is the second blog in a series examining challenges around defect detection and correction. Here, I describe the ideal process control solution for the AI Era and discuss what it will take to make it a reality.
Getting from R&D to high-volume manufacturing of new technology nodes is a complex process gated primarily by the ability to detect and correct defects. The methods used by the industry to perform defect inspection and review have remained relatively the same for decades. It is now time for a new approach—one that is optimized for the AI Era.