Semiconductors Using e-Beam Metrology for Layer-to-Layer Overlay by Adam Ge, Shimon Levi Oct 05, 2017 Patterning challenges for the semiconductor industry are growing as the number of multi-patterned layers being used in the 10nm and beyond nodes increase. Read more
Semiconductors Perspectives on the Semiconductor Industry in the Year Ahead by Applied Materials Blog Jan 26, 2017 Scaling and emerging applications are driving market and technology changes. Read more
Semiconductors How New Materials Can Solve Contact Resistance by Mike Chudzik Jan 12, 2017 Changing materials in the contact can lower resistance and improve yield in sub-10nm chip designs. Read more
Semiconductors Fins and Wires. How do we get to 5nm? by Mike Chudzik Aug 09, 2016 Evolutionary changes in materials and device structures critical for next generation of device scaling. Read more