Semiconductors

Applied Materials will be presenting in five sessions at PRiME 2016, one of the largest international research conferences, being held October 2-7 in Honolulu, Hawaii.

New materials offer competitive benefits over silicon in a growing number of power device applications, but cost and technology challenges remain daunting.

Semiconductor industry analyst and CEO of VLSIresearch Inc., G. Dan Hutcheson discusses the radically different Producer® Selectra™ etch system and extreme selectivity's importance for the industry. 

Applied Materials’ Open Innovation Workshop brought together key stakeholders and thought leaders in augmented and virtual reality.

An animation shows how collecting a massive number of measurements and mapping them across a wafer reveal valuable information on process variations to expedite identifying the root cause. 

An in-depth review of the power device market and changes driving technology innovations.

Evolutionary changes in materials and device structures critical for next generation of device scaling.

An animation shows the complexity of a FinFET array and examples of the defects that can occur during device fabrication but are difficult to detect among densely packed, high aspect ratio features.

The newest in Applied Materials’ suite of ebeam products, the PROVision™ system, delivers the industry’s highest resolution at the fastest throughput, detecting defects never before seen. Watch this brief video to learn more about this breakthrough system and the challenges it solves.