Our blog is dedicated to a global discussion about the ideas, actions and technologies changing the world as we know it.
Abhinav Jain is an application engineer at Applied Materials working with the GLOBALFOUNDRIES account team. He is experienced in process integration and supports ebeam applications. He holds a U.S. patent and has authored more than 15 publications on semiconductor spintronics, epitaxial growth and device fabrication. Abhinav earned a Ph.D. in physics from the University of Grenoble, France.
The ability to detect and identify defects becomes increasingly difficult as chips continue to shrink. In this blog, I discuss a new approach to Defect Review Scanning Electron Microscopy that increases sensitivity of defect identification and isolates true defects from the noise.