I recently sat down for a video interview with G. Dan Hutcheson, CEO of VLSIresearch, to discuss why the industry is moving to new memory solutions and what strategies are being implemented to alleviate the memory bottleneck.
An animation shows how collecting a massive number of measurements and mapping them across a wafer reveal valuable information on process variations to expedite identifying the root cause.
An animation shows the complexity of a FinFET array and examples of the defects that can occur during device fabrication but are difficult to detect among densely packed, high aspect ratio features.
