The ability to detect and identify defects becomes increasingly difficult as chips continue to shrink. In this blog, I discuss a new approach to Defect Review Scanning Electron Microscopy that increases sensitivity of defect identification and isolates true defects from the noise.
I recently sat down for a video interview with G. Dan Hutcheson, CEO of VLSIresearch, to discuss why the industry is moving to new memory solutions and what strategies are being implemented to alleviate the memory bottleneck.
As the semiconductor industry begins producing logic devices for the single digit nodes, new conductors are being evaluated as replacements for copper to manage resistance scaling. Applied Materials’ Mehul Naik highlights one of the leading contenders.