A Quantum Future will be here Sooner than You Think

Our recent Open Innovation Workshop brought together quantum technology leaders from across the ecosystem to identify key challenges in quantum information systems and explore opportunities for collaboration. The central theme that emerged from the day is that quantum is about so much more than computing; there are many applications in areas like sensing, metrology and communications encryption on the near-term horizon.

Designing “Eyes” into Process Equipment to Improve Chip Performance and Yield

Metrology allows process engineers to see the results of process steps. Today, driving improvements in chip performance, power and area/cost (PPAC) requires novel architectures and exotic material stacks. This is introducing new sources of atomic-scale variation that can negatively impact chip performance and yield. It is becoming imperative to “watch” the deposition process as it occurs to control variability and deliver repeatable performance.